Metal Plating

Monitor major and minor plating bath elements simultaneously to improve product quality

Robust monitoring of plating baths for optimal performance

  • Simultaneous measurement of major bath components and potential contamination elements
  • Reduced operational costs with robust N₂ plasma
  • Increased operational uptime
  • Simple operation – easy to train additional operators
MICAP-OES 1000
MICAP-OES 1000
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Features & Benefits

What can our instruments do for you?

  • Use robust nitrogen plasma with superior matrix tolerance.
  • Simultaneous measurement for fast analysis times.
  • Smallest footprint and light-weight design.
  • Reduced running cost/analysis.
  • Easy-to-use Windows-based graphical user interface of RIS software package.
  • The ability to display, store and recall spectra for every sample analyzed data display and reprocessing, without the need to rerun samples (original data is unchanged).
  • Automated robust wavelength accuracy algorithm to ensure wavelength stability for extended sample runs.

Resources

Product Literature

Application Note

Monitoring of Plating Baths with a Compact N₂ ICP-OES system

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The Technology That Changes Everything

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